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Optical Test Equipment
AQ6375B Long Wavelength Optical Spectrum Analyzer 1200 - 2400 nm
Product code Q7CAHK
The AQ6375B is a bench-top optical spectrum analyzer covering the long wavelengths, 1200 to 2400 nm, with the added benefits of gas purging input ports / output ports, a built-in cut filter for high order diffracted light, and a novel double speed mode which increases the sweep speed up to 2 times compared to the standard sweep mode.
Long wavelength range: 1200 to 2400 nm
Gas purging ports to reduce water vapor effects
Built-In cut filter for high order diffracted light
Double Speed Mode to further enhance fast measurement speed
High sensitivity down to -70 dBm
High resolution to 0.050 nm
Wide close-in dynamic range (55dB)
Fast auto-calibration
Free space optical input for maximum flexibility, low maintenance, and high reliability
Applicable to single-mode and multimode fibers
Excellent performance for environmental gas sensing Laser Spectroscopy Indispensable tool for R&D and manufacturing of optical devices in the wavelength range from telecom band to 2.4μm
SIMILAR PRODUCTS

The AQ6360 is the fastest optical spectrum analyzer for optical device manufacturing offered by Yokogawa. It is a cost-effective optical spectrum analyzer ideal for industrial manufacturing of telecom devices such as lasers, optical transceivers and optical amplifiers. The AQ6360 features a wavelength range of 1200 to 1650 nm for ideal manufacturing test performance. Its free space optical input structure design allows for guaranteed high coupling efficiency and measurement repeatability. Additional features and functions of the AQ6360 include built-in analysis functions and Ethernet and GPIB remote interfaces.
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High performance OTDR module for RFTS (Remote Fiber Test System) The AQ7277B is OTDR modules for RFTS (Remote Fiber Test System) including features required for monitoring fibers.
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The AQ2200-642 reduces the complexity and cost of 10G optical transceiver testing by combining bus and power control features into the same mainframe that performs Signal Generation, BERT and Optical testing. This allows a single programming interface to control all aspects of the transceiver test, simplifying test setup, decreasing test time and increasing productivity. The wiring complexity and test bench size are reduced by replacing separate Digital Multi-Meters, Programmable Power supplies and Serial I/F controllers with a single module.
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