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Zinc/Zn
Optical Test Equipment
AQ6376 Three Micron Optical Spectrum Analyzer 1500 - 3400 nm
Product code 1OG5OQ
The AQ6376 is the latest version of our bench-top optical spectrum analyzer extending the wavelength coverage well beyond the NIR range of our previous models into the MWIR region from 1500 to 3400 nm. Popular applications include the detection of gases such as carbon oxides (COx), nitrogen oxides (NOx), and hydrocarbon gas (CxHy) for environmental studies. Similar to the long wavelength model, it offers the added benefits of gas purging input ports / output ports, a built-in cut filter for high order diffracted light, and a novel double speed mode which increases the sweep speed up to 2 times compared to the standard sweep mode.
- Long wavelength range: 1500 to 3400 nm
- Gas purging ports to reduce water vapor effects
- Built-In cut filter for high order diffracted light
- Double Speed Mode to further enhance fast measurement speed
- High sensitivity down to -65 dBm
- High resolution to 0.10 nm
- Wide close-in dynamic range (55dB)
- Fast auto-calibration
- Free space optical input for maximum flexibility, low maintenance, and high reliability
- Applicable to single-mode and multimode fibers
- Excellent performance for environmental gas sensing Laser Spectroscopy
- Indispensable tool for R&D and manufacturing of optical devices in the wavelength range from telecom band to 3.4μm
Specification Sheet
High performance OTDR module for RFTS (Remote Fiber Test System) The AQ7277B is OTDR modules for RFTS (Remote Fiber Test System) including features required for monitoring fibers.
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The AQ2200-131 and AQ2200-132 are single and dual channel tunable light source modules. The output wavelength can be conveniently set to the predefined DWDM grid channels.
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The AQ2200-642 reduces the complexity and cost of 10G optical transceiver testing by combining bus and power control features into the same mainframe that performs Signal Generation, BERT and Optical testing. This allows a single programming interface to control all aspects of the transceiver test, simplifying test setup, decreasing test time and increasing productivity. The wiring complexity and test bench size are reduced by replacing separate Digital Multi-Meters, Programmable Power supplies and Serial I/F controllers with a single module.
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