AQ6370 İzleyici

The AQ6370D is the latest iteration of the most popular Telecom class OSA from Yokogawa. It offers a versatile wavelength range of 600 nm to 1700 nm ideally suited for both Telecommunications and general purpose applications. The unique free space input design allows testing of both DWDM class singlemode and VCSEL sourced multi-mode fibers in one single model. Newly added functions include data logging, gate sampling,resolution calibration, an advanced marker function and an enhanced auto-sweep mode.

The AQ7280 is the most flexible OTDR in our lineup due to a modular platform to create a variety of systems from a basic unit to units with filtered ports to test live traffic networks in applications from long haul, to metro, core and FTTH. 35+ years of OTDR expertise has enabled us to offer a unique multi-tasking feature that allows four distinct fibers to be tested simultaneously. Its intuitive icon-based touchscreen lets users perform measurements with ease, and the 15-hour battery life ensures uninterrupted usage in the field where the data can be conveniently transferred wirelessly.

The AQ6151B Optical Wavelength Meter is an ideal instrument for accurately measuring the optical wavelength of optical devices and systems with wavelength ranges from 900 nm to 1700 nm. By employing a Michelson interferometer and a high speed Fast Fourier Transform (FFT) algorithm, the AQ6151B can measure not only a single wavelength laser signal, but also a multiple wavelength laser signal from a DWDM system and Fabry-Perot laser. Furthermore, this technology enables the measurement of modulated laser signals in addition to the CW signal from an optical transceiver. The optimized optical design and data processing routine significantly reduces the measurement time and improves manufacturing throughput

The AQ2200-412 OSW module is a space-saving 1 x 16 optical switch featuring low insertion loss and superior switching reproducibility, in a two-slot size module. This module allows to connect up to 16 DUT and improve testing efficiency in automatic test system.